On a double-sided automated optical inspection (AOI) station, print fixed key actions on the graphic overlay. Use the screen to identify the board, the side being viewed, and the viewing direction. Rotating or mirroring an image changes how it is displayed; the defect record should still point to the same spot on the same physical side. Check that link against the board itself and the saved record.
On November 9, 2026, TRI announced the TR7700Q TB SII, with 3D inspection from above and 2D inspection from below. That raises a question for a separate project that reviews both sides at one station: when an operator switches back from the bottom view, can they still find the previous defect on the correct side of the actual board? The announcement does not disclose the machine's overlay or review keys, or identify Baoshengda as a supplier.
Flipping the image does not change the defect's board side
The KiCad 7.0 PCB Editor manual gives an example of a viewing convention: flipping the board view lets you look at it as if from below. That convention does not prescribe an AOI coordinate system. Define board sides and reference points on the controlled drawing first. Separately record how the board is loaded, which side the image looks from, and any rotation or mirroring. If the drawing defines sides A and B, their identities do not change with their position on the screen.
Before printing, confirm what the key does. If it only moves between the two inspection images, use an action label such as “Switch view” and identify the active side on screen. If it changes the inspection program, do not use the same label for both actions. See how to check text, symbols and color together (Chinese) before sampling. The instrument port overlay guide (Chinese) covers the related distinction between a physical identifier and a software label.
Walk through defect review with an asymmetric test board
In an approved setup mode, use an identifiable non-production board or an approved verification sample. Choose an easy-to-find feature on each side from the controlled drawing, at positions that are not symmetric. Record the sample identity, loading orientation and expected locations. Then check the side changes and viewing options the project will actually use:
- Open the other side on screen. The displayed side should change, but the newly displayed image should not overwrite the side associated with the selected defect.
- Rotate or mirror an image of the same side. The marker may move on screen, but the record should still identify the same physical feature on the same side. The upper-left corner of a screenshot is not a reliable location reference on its own.
- Give the exported record to a second reviewer. Using only the board ID, side, locating reference and any necessary view information, can they find the same spot on the test board? If not, check the side and coordinate mapping before changing the overlay artwork.
Shenzhen Baoshengda Technology Co., Ltd.'s custom graphic overlay and keypad overlay page (Chinese) lists equipment legends, operating instructions and display windows as project inputs. A surface overlay on its own does not include switch circuitry. See the English product page or contact us with a key action list, screen viewing area and window drawing you are permitted to share. Verify the overlay and the software separately. The cover illustrates a window and key areas on a different instrument panel sample. It is not an AOI machine photo or a system validation result.